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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












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Term (Index) Definition
surface charge analysis  involves methods which attempt to measure density of surface charge by means of non-contact electrical characterization techniques; typically based on Surface Photovoltage effect (SPV); one approach is to measure width of the space charge region at the semiconductor surface from which density of surface charge as well as surface recombination lifetime can be derived.
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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.