Semiconductor Glossary, Developed Semi OneSource.

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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.


Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.

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Term (Index) Definition
non-contact electrical characterization  methods allowing determination of selected characteristics of semiconductor and/or its surface without making contact to the surface; to perform measurements equilibrium of the near-surface region must be disturbed typically by illumination with light with energy exceeding width of the energy gap of semiconductor.
surface charge analysis  involves methods which attempt to measure density of surface charge by means of non-contact electrical characterization techniques; typically based on Surface Photovoltage effect (SPV); one approach is to measure width of the space charge region at the semiconductor surface from which density of surface charge as well as surface recombination lifetime can be derived.
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Jerzy Ruzyllo is a Distinguished Professor Emeritus in the Department of Electrical Engineering at Penn State University.

This book gives a complete account of semiconductor engineering covering semiconductor properties, semiconductor materials, semiconductor devices and their uses, process technology, fabrication processes, and semiconductor materials and process characterization.

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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.