Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












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Term (Index) Definition
four-point probe  the most common techniques for measuring resistivity of semiconductors; uses four equally spaced metal probes touching semiconductor, two outside probes are used to flow the current in semiconductor while two inside probes measure resulting voltage drop which is proportional to semiconductor resistivity (doping level).
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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.