Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.


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Term (Index) Definition
electromigration  an effect plaguing some metals in particular aluminum; physical motion of atoms out of the areas where current density is very high; caused primarily by frictional force between metal ions and flowing electrons; results in the break in the metal line; common cause of malfunction of aluminum interconnect network in integrated circuits; main reason for which Al interconnects are being replaced with copper interconnects in advance IC technology.
aluminum, contaminant, Al  common metallic contaminant in silicon processing; main source: APM cleaning solution; slows down thermal oxidation of silicon if not removed prior to oxidation; affects oxide reliability; detection and measurement on Si surface by TOF-SIMS.
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Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.