Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.


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Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.


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Term (Index) Definition
electromigration  an effect plaguing some metals in particular aluminum; physical motion of atoms out of the areas where current density is very high; caused primarily by frictional force between metal ions and flowing electrons; results in the break in the metal line; common cause of malfunction of aluminum interconnect network in integrated circuits; main reason for which Al interconnects are being replaced with copper interconnects in advance IC technology.
aluminum, contaminant, Al  common metallic contaminant in silicon processing; main source: APM cleaning solution; slows down thermal oxidation of silicon if not removed prior to oxidation; affects oxide reliability; detection and measurement on Si surface by TOF-SIMS.
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Jerzy Ruzyllo is a Distinguished Professor Emeritus in the Department of Electrical Engineering at Penn State University.



This book gives a complete account of semiconductor engineering covering semiconductor properties, semiconductor materials, semiconductor devices and their uses, process technology, fabrication processes, and semiconductor materials and process characterization.


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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.