Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.


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Term (Index) Definition
copper, Cu  (i) metal of choice for interconnects in advanced ICs; resistivity the lowest among metals - 1.7 µohm-cm; advantages over aluminum: no electromigration and lower resistivity; (ii) defect causing contaminant if allowed to penetrate silicon; very fast diffusant in silicon; results in reduced lifetime of minority carriers.
copper interconnect  an interconnect scheme in advanced integrated circuits using copper as a metal for interconnect lines.
interconnect  conductor (typically metal) line connecting elements of an integrated circuit; in very high density integrated circuits interconnect lines form multilevel network; in advanced silicon ICs interconnect lines as are made out of copper.
metallic contaminant  atoms of metals deposited on the Si surface during device processing as a reult of process malfunction; common metallic contaminants: Fe, Al, Cu, Ca, Na; originate from process chemicals, ambient, and tools; major reliability problem; should not be allowed on Si surface in concentrations above 109 cm-2; designated cleans are applied to remove metallic contaminants from the surface.
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Created and operated by J. Ruzyllo. Copyright © J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.