Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












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Term (Index) Definition
bias-temperature stress  see BTS
BTS  bias-temperature stress; reliability test in which device is electrically stressed at increased temperature; commonly used in C-V characterization of MOS devices.
capacitance-voltage, C-V, measurements  several parameters of semiconductor materials and structures can be determined by measuring C-V characteristics; routinely used for process diagnostics and monitoring in MOS technology; allows determination of interface trap density, fixed charge and oxide charge.
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Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.