Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












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Term (Index) Definition
Total Reflection X-Ray Fluorescence spectroscopy, TXRF  a method very effective in detecting metallic contaminants on the wafer surface; detection of the energy of photons emitted from atoms on the surface as a result of X-ray irradiation at the angle assuring total external reflectance.
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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.