Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.


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Term (Index) Definition
Scanning Electron Microscopy, SEM  imaging method with lateral resolution better than 10 nm; focused beam of electrons is scanned across a sample; image constructed based on the detection of secondary electrons current; studied material must be coated with a conductive film; very useful in semiconductor technology.
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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.