Semiconductor Glossary, Developed Semi OneSource.
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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.












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Term (Index) Definition
SIMS  Secondary Ion Mass Spectroscopy; material characterization method; atoms sputtered off the surface are identified by determination of their mass (mass spectroscopy); conventional dynamic SIMS features high sputtering rate while static SIMS uses extremely low sputtering rate allowing better sensitivity to the characteristics of the very surface; allows depth profiling.
surface analysis  process aimed at the determination of chemical composition and/or structure of solid surfaces.
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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.