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Sunday, August 8, 2021

#475 Electrical characterization of perovskite


In December last year (blog #464) I posted quick comments regarding growing impact of semiconductor materials featuring perovskite structure, and known as perovskites. In March this year in turn (blog #464), I was elaborating on the potential of crystals electrical characterization employing RF-based, non-contact electrical measurement system.


There is no doubt in my mind the latter could be very effective in sorting out very fine structural defects-related issues in perovskite semiconductors applied for instance in photovoltaics.


There is one problem, though. Somebody will need to invest and build a tool to carry out these measurements.  See here what can be done in this regard.


Posted by Jerzy Ruzyllo at 02:09 PM | Semiconductors | Link is a personal blog of Jerzy Ruzyllo. He is Distinguished Professor Emeritus in the Department of Electrical Engineering at Penn State University. With over forty years' experience in academic research and teaching in semiconductor engineering he has a unique perspective on the developments in this technical domain and enjoys blogging about it.

This book gives a complete account of semiconductor engineering covering semiconductor properties, semiconductor materials, semiconductor devices and their uses, process technology, fabrication processes, and semiconductor materials and process characterization.

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