Semiconductor Glossary, Developed Semi OneSource.

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With over 2000 terms defined and explained, Semiconductor Glossary is the most complete reference in the field of semiconductors on the market today.


Including some 500 new terms defined and remaining terms updated and modified, a 2nd edition book version of this glossary is now available.

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Term (Index) Definition
Van der Pauw method  measurement of the resistivity of semiconductor using four probes (contacts) located on its surface; alternate contacts are used to measure two sets of current-voltage characteristics and then to extract value of resistivity from the formula.
four-point probe  the most common techniques for measuring resistivity of semiconductors; uses four equally spaced metal probes touching semiconductor, two outside probes are used to flow the current in semiconductor while two inside probes measure resulting voltage drop which is proportional to semiconductor resistivity (doping level).
resistivity  resistance per unit area and unit length; expressed in ohm-cm; the reciprocal of conductivity.
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Jerzy Ruzyllo is a Distinguished Professor Emeritus in the Department of Electrical Engineering at Penn State University.

This book gives a complete account of semiconductor engineering covering semiconductor properties, semiconductor materials, semiconductor devices and their uses, process technology, fabrication processes, and semiconductor materials and process characterization.

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Created and operated by J. Ruzyllo. Copyright J. Ruzyllo 2001-2016. All rights reserved.

Information in this glossary is provided at the author's discretion. Any liability based on, or related to the contents of this glossary is disclaimed.